The IYM system for industrial site management. With years of experience in industrial analysis, comprehensive analysis templates, advanced and rich data models, we help clients to tackle product defects accurately and efficiently from the aspects of yield monitoring
Insufficient methods
In terms of solving yield problem and offering improvement strategy, there is a lack of data-based, systematic, and scientific analysis methods.
Low efficiency
Traditional methods and system tools are slow in data extraction and analysis, thus are inadequate in dealing with anomalies.
Poor flexibility
The solidification analysis can meet the requirements of conventional anomaly analysis, but cannot be used for efficient analysis of complex, multi-variant issues.
Low intelligence level
Descriptive tools such as visual reports, instead of intelligent applications, are used in forecasting and prevention.
One-stop analysis has shortened analyzing time from days to hours or even minutes, therefore improving the efficiency considerably.
Analytical models and predictive models can monitor the abnormalities in quality, prevent the flow of defective products to the next process, and improve the overall product yield.
Integrating FDC, SPC, APC, etc., a comprehensive process control system is created to manage anomalies through a closed loop mechanism of interception, analysis and response.
Employing yield rate analysis, production line monitoring and so on, to reduce production capacity Loss, save manpower and increase overall revenue.
Semiconductor material crystallization and slicing, chip manufacturing, packaging, design companies
OLED panel manufacturing and assembly companies
Crystallization and slicing, photovoltaic chip manufacturing, photovoltaic module companies
Printed circuit board industry and other industries that require integrated analysis of engineering data
Client: Semiconductor Display Company Outcome: This semiconductor display company used to rely on manual monitoring to detect anomalies. Efficiency was low when multiple, complex and uncertain factors were involved, or when all equipment, parameters, eigenvalues were in need of analyzing. The company’s analyzing tools were inadequate.
GeTech employed Al+BigData to frame the analysis strategy for the engineers. Through Integrating MFA, KPC, Spotfre , an intelligent platform was built to solve yield problems by analyzing the correlation between product yield rate and time, machine, parameters and eigenvalues. The one-stop yield report enquiry and analysis system significantly improved efficiency and helped the engineers to locate anomaly promptly. The time spent on resolving anomalies has been reduced from days to hours. The users can analyze and do modeling promptly and independently. The extraction of comprehensive equipment parameters in any production process can be done with easy while the time spent on it has been shortened by ten times. The time spent on the one stop analysis report (generating+ machine + parameters) has been shorten by about 50 times, and the comprehensive yield increased by 3%, saving over 6 million per year.
